New Product Launch | DC to 165 GHz Titan Probes with 0.8mm Connector At IMS 2025, Ron Dichio introduced MPI Corporation’s latest innovation—DC to 165 GHz Titan RF probes using a 0.8mm connector, pushing well beyond the traditional 145 GHz limit. These new probes are engineered for low loss systems (Load Pull and Noise Parameters) also demanding ultra-high-frequency performance, and they come packed with features that raise the bar: 🔍 Visible Probe Tips – Improve measurement repeatability by enabling accurate placement on DUTs and calibration standards. 🎯 Independent Tip Movement – Each signal and ground tip moves independently for optimized probing, unlike many fixed designs. ⚙️ Precision MEMS Manufacturing – Delivers unmatched clarity, pitch control, and coplanarity. With this launch, MPI continues to push the boundaries of mmWave wafer-level testing and reinforce its leadership in RF probing. #RFTesting #mmWave #SemiconductorTesting #IMS2025 #MPI #TITANProbes #165GHz #MEMS #WaferProbing
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旺矽科技股份有限公司創立於1995年7月,以客戶導向的核心經營理念、不斷開發最新科技及尖端製造技術,提供客戶最佳產品及服務,產品跨越多領域產業,主要產品市場包括探針卡測試方案、LED及光電測試解決方案、高低溫測試系統、先進半導體測試解決方案等,服務的產業包括半導體、材料研究、航太(航天)、汽車、光學纖維、電子零組件…等。 旺矽科技以提升客戶競爭力為主要目標,在技術上不斷研發創新,提供客戶最佳測試解決方案,以創造客戶價值為我們的職志。 更多資訊請見我們的官方網站:mpi-corporation.com
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https://www.mpi-corporation.com
外部旺矽科技股份有限公司連結
- 產業
- 半導體製造
- 公司規模
- 1,001-5,000 名員工
- 總部
- ZhubeiHsinchu
- 類型
- 上市公司
- 創立時間
- 1995
- 專長
- Test & Measurement、Probe Card、Engineering Probe Systems、RF Probes、Temperature Test Systems、Thermal Air Stream Systems、Probe Stations、Test Equipment、Vertical Probe Cards、Cantilever Probe Cards、Wafer Prober、Die Prober、Die Sorter、Automated Optical Inspection System和Photonics Tester
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旺矽科技股份有限公司員工
動態消息
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We’re proud to partner with Keysight Technologies for our exclusive Open House on Tuesday, August 5th in San Jose, CA—a unique opportunity to explore cutting-edge wafer-level measurement solutions in a live environment. As part of the event, Dr. Joel Dunsmore, Keysight R&D Fellow, will deliver a keynote presentation: “Evolution of the VNA for High Precision On-Wafer Complex 6G Measurements.” Dr. Dunsmore will share insights into the future of vector network analysis and its role in enabling advanced wafer-level characterization and next-generation communications. Keysight will also showcase their latest measurement system, launched just days prior, in a joint demo with MPI’s TS2000-IFE automated probe station—highlighting how our combined technologies address today’s most demanding test challenges. Additional demos will include: Silicon Photonics (PIC) probing High-frequency PCB validation Load Pull and Noise Parameter measurements And more If you’re attending, we invite you to schedule a demo and discover how Keysight and MPI are delivering complete, integrated solutions for high-frequency, high-precision device testing. ✉️ email MPIAevents@mpi-corporation.com for more details or to schedule a demo. 🔗 TS2000-IFE Automated Probe Station https://lnkd.in/gemshPbT #keysightsolutionpartner
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Great to see our TS3000 Probe System supporting such innovative research at SPCS Queen Mary, University of London! Proud to be part of the work advancing radiation sensors. 👉 #MPICorporation #TS3000 #semiconductors #probestation #radiationdetectors #innovation
The detector development group in the SPCS Queen Mary, University of London works on a broad range of radiation detectors for particle physics and real world applications. One of these is a set of organic semiconductor radiation sensors that we make in house, and tailor to the application need. This short video clip shows a device one of our PhD students is working with. we are using the laser attachment for our MPI Corporation TS-3000 probe station to scan across an organic sensor to understand the position sensitivity of the device. When we purchased this fantastic piece of kit we did so with silicon detector development in mind (we have a long history of working with strip and CMOS pixel sensors). Since installation we have found that this is also an excellent tool for us to use with our CVD diamond and organic semiconductor work. So much so that we sometimes have to queue up to get time on the machine. We are now at the stage of exploring options for commercialisation of our organic semiconductor sensors. If you're a company interested in exploring commercialisation prospects of this technology with us please send me a direct message.
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Enabling Accurate, Scalable mmW + sub-THz Wafer-Level Testing MPI Corporation, in collaboration with Keysight Technologies and Virginia Diodes, Inc., delivers a high-performance solution for wafer-level wideband modulated device characterization. This joint development turns complex sub-THz testing into a fast, simple, and accurate process--enabling high-fidelity measurements for next-generation wireless technologies like 6G. ✔️ <1% EVM on 256QAM at wafer level ✔️ Scalable from manual to fully automated probe stations (like TS2000-IFE) ✔️ Seamless integration with Keysight’s PNA-X and waveform generators ✔️ High-precision, automated RF calibration via QAlibria® ✔️ Supports both GSG and differential probing Applications include: 6G RFIC testing, antenna-in-package validation, modulated load-pull, and high-volume wafer screening. This is how system-level innovation bridges the gap between advanced measurement and real-world deployment. Read the brief now to learn more! https://lnkd.in/eND2aybU 🔗 MPI Corporation TS2000-IFE Series: THZ Selection https://lnkd.in/evnJfMYY 🔗 MPI Corporation TS150-THZ Prove System https://lnkd.in/ey-8SwY9 #6G #mmWave #subTHz #RFTesting #Semiconductors #WaferLevel #RFIC #AiP #VDI #Keysight #MPIcorporation #TestAndMeasurement
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🎯 Metrology-Grade RF Calibration—Simplified In mmWave and RF characterization, calibration precision defines measurement accuracy. MPI’s QAlibria® software is engineered for confident and reproducible RF and mWave calibrations—delivering metrology-grade performance through advanced automation and NIST-aligned calibration methods. 🔍 Key technical capabilities include: True NIST multiline TRL for mmWave/THz applications Proprietary TMR/TMRR calibration for maximum accuracy with custom on-wafer standards Multi-touch interface with progressive-disclosure UX for intuitive use Automated substrate alignment, VNA configuration, and probe recognition Error-reduction tools like intelligent calibration method selection and configuration monitoring. With built-in support for TITAN™ Probes and seamless integration with MPI probe stations, QAlibria® is designed to reduce operator variability and ensure reproducible, high-integrity data—faster. 🔗 Explore QAlibria® in detail https://lnkd.in/eJpAKkc9 #RFTesting #mmWave #OnWaferTest #TITANProbes #QAlibria #TRLCalibration #VNA #RFCharacterization #MetrologyGrade
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We extend our warmest congratulations to Tianze Li of Cornell University for winning the Best Interactive Forum Paper Award at the 104th ARFTG Conference! Her award-winning paper, “Ultra-Wideband Multi-Line Calibration by Microstrip and Coplanar Impedance Standards on the Same GaAs Chip,” showcases innovative work that pushes the boundaries of ultra-wideband calibration and on-wafer measurement technology. We’re proud that MPI Corporation’s advanced probe station and calibration solutions — including the TS2000-SE IceFreeEnvironment, QAlibria® Calibration Software, and TITAN™ T220MA and T220MS Differential Probes — enabled Tianze and her team to perform 4-port single-sweep measurements from DC to 220 GHz with outstanding precision. This marks the fourth ARFTG award for Tianze Li and Prof. Hwang’s cutting-edge group — a testament to their continued leadership in millimeter-wave research. At MPI, we are honored to support educational institutions and the next generation of microwave engineers as they drive the industry forward. 👏 Congratulations again to Tianze and the entire team at Cornell! #TitanProbes #QAlibria #RFprobing #OnWaferTest #TitanPerformance Anritsu TIANZE LI Jon Martens
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Check out our Manual TS200 featuring G-Band Noise Parameters on Focus Microwaves Booth 659 👀
As the industry advances into the era of 6G and the exploration of the sub-THz spectrum, Focus MW is at the forefront of innovation. We are proud to present our latest G-band noise parameter extraction solution, covering 140–220 GHz — a state-of-the-art system designed for next-generation mmWave and terahertz applications. This cutting-edge solution offers unmatched precision and performance, supporting the development of future-proof devices and systems in high-frequency communications and sensing. 👉 Visit us at IMS Booth #659 to see it in action! #FocusMicrowaves #6G #mmWave #Terahertz #NoiseParameters #RFInnovation #IMS2025 #Booth659
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Day 3 of #IMS2025, still busy at the booth, great technical conversations happening, last day to come talk with us!
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Day 2 at #IMS2025 Bring your toughest measurement challenges to Booth #1553, we’re Ready for the Test 😤💪
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Live Demo at #IMS2025! We’re featuring a high-performance harmonic load pull setup on our TS200 manual probe system, operating at a 15GHz fundamental with load control up to 67GHz. This demonstration brings together AMCAD’s pulsed power solution, Focus Microwaves’ harmonic tuners, and Dassault Systèmes SIMULIA’s IVCAD advanced software environment, delivering a tightly integrated measurement solution for mmWave GaN transistor characterization. The result is a robust and efficient setup that offers repeatability, bandwidth, and control — all key for transistor modeling while operating in high-frequency load pull applications. Now part of Dassault Systèmes, AMCAD Engineering team continues to lead in RF test innovation through hardware and software synergy. 📍 Booth 2043 | IMS2025 | San Francisco #IMS2025 #LoadPull #HarmonicTuning #mmWave #67GHz #WaferLevelTesting #PowerAmplifier #AMCAD #FocusMicrowaves #MPICorp #TS200 #RFTesting
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